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학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
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연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2012.10
- 수록면
- 203 - 211 (9page)
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초록· 키워드
오류제보하기
Atomic force microscopy (AFM) has been used as a tool, not only for imaging surfaces, but also for measuring surface forces and mechanical properties at the nano-scale. Force calibration is crucial for quantitatively measuring the forces that act between the AFM probe of a force sensing cantilever and a sample. In this work, the lateral force calibrations of a V-shaped cantilever were performed using the finite element method, multiple pivot loading, and thermal noise methods. As a result, it was shown that the multiple pivot loading method was appropriate for the lateral force calibration of a V-shaped cantilever. Further, through crosschecking of the abovementioned methods, it was concluded that the thermal noise method could be used for determining the lateral spring constants as long as the lateral deflection sensitivity was accurately determined. To obtain the lateral deflection sensitivity from the sticking portion of the friction loop, the contact stiffness should be taken into account.
목차
Abstract
1. 서론
2. 연구방법
3. 연구결과 및 고찰
4. 결론
참고문헌
참고문헌 (20)
참고문헌 신청
Binnig, G. / 1986 / Atomic Force Microscope / Phys Rev Lett 56:930~933
정구현 / 201003 / Nanomechanical Properties of Thin Films of Type I Collagen Fibrils / LANGMUIR 26(5):3629~3636
Giesbers, A. J. M. / 2008 / Nanolithography and Manipulation of Graphene using an Atomic Force Microscope / Solid State Commun 147:366~369
Bordag, M. / 2007 / Shear Stress Measurements on InAs Nanowires by AFM Manipulation / Small 3:1398~1401
Bharat Bhushan / 2008 / Nanotribology and Nanomechanics of AFM Probe-Based Data Recording Technology / J Phys: Condens Matter 20:365207
정구현 / 201003 / Nanomechanical Properties of Thin Films of Type I Collagen Fibrils / LANGMUIR 26(5):3629~3636
Giesbers, A. J. M. / 2008 / Nanolithography and Manipulation of Graphene using an Atomic Force Microscope / Solid State Commun 147:366~369
Bordag, M. / 2007 / Shear Stress Measurements on InAs Nanowires by AFM Manipulation / Small 3:1398~1401
Bharat Bhushan / 2008 / Nanotribology and Nanomechanics of AFM Probe-Based Data Recording Technology / J Phys: Condens Matter 20:365207
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