지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술대회자료
- 저자정보
- 발행연도
- 2012.11
- 수록면
- 357 - 362 (6page)
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초록· 키워드
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This paper demonstrates an efficient diagnosis-after-test (DAT) procedure for testing the Fleischer-Laker SC biquad based on the static linear behavior (SLB) analog fault model. For typical switched-capacitor (SC) filter design, the transfer functions are mainly determined by capacitor ratios. Therefore, the practical capacitor ratios are important parameters for designers to diagnose their designs. The DAT procedure can not only test for the real transfer function of the SC biquad for making reliable pass/fail decision without conducting many tests, but also diagnose the capacitor ratios of the SC biquad. With the diagnosis results, designers can find out which capacitors cause the failure and revise the design for a better yield. Mathematical analysis shows that the entire DAT procedure requires only a three-tone test, which implies a very short test time. A second-order low-pass filter adopting the E-circuit of the Fleischer-Laker SC biquad is taken as a test example. Simulation results show the DAT procedure can provide good test accuracy with the three-tone test data. In addition, the test achieves a 100% parametric fault coverage of the capacitor ratios defined by the SLB fault model for the Fleischer-Laker SC biquad.
목차
Abstract
Ⅰ. INTRODUCTION
Ⅱ. REVIEW OF THE STATIC LINEAR BEHAVIOR ANALOG FAULT MODEL
Ⅲ. DIAGNOSIS FOR CAPACITOR RATIOS
Ⅳ. SIMULATION RESULTS
Ⅴ. CONCLUSIONS
REFERENCES
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UCI(KEPA) : I410-ECN-0101-2014-569-000729905