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논문 기본 정보

자료유형
학술저널
저자정보
Sejung R. Chae (University of California at Berkeley) Juhyuk Moon (University of California at Berkeley) Seyoon Yoon (University of California at Berkeley) Sungchul Bae (University of California at Berkeley) Pierre Levitz (Université Pierre et Marie Curie) Robert Winarski (Argonne National Laboratory) Paulo J. M. Monteiro (University of California at Berkeley)
저널정보
한국콘크리트학회 International Journal of Concrete Structures and Materials International Journal of Concrete Structures and Materials Vol.7 No.2
발행연도
2013.6
수록면
95 - 110 (16page)

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초록· 키워드

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We report various synchrotron radiation laboratory based techniques used to characterize cement based materials in nanometer scale. High resolution X-ray transmission imaging combined with a rotational axis allows for rendering of samples in three dimensions revealing volumetric details. Scanning transmission X-ray microscope combines high spatial resolution imaging with high spectral resolution of the incident beam to reveal X-ray absorption near edge structure variations in the material nanostructure. Microdiffraction scans the surface of a sample to map its high order reflection or crystallographic variations with a micron-sized incident beam. High pressure X-ray diffraction measures compressibility of pure phase materials. Unique results of studies using the above tools are discussed?a study of pores, connectivity, and morphology of a 2,000 year old concrete using nanotomography; detection of localized and varying silicate chain depolymerization in Al-substituted tobermorite, and quantification of monosulfate distribution in tricalcium aluminate hydration using scanning transmission X-ray microscopy; detection and mapping of hydration products in high volume fly ash paste using microdiffraction; and determination of mechanical properties of various AFm phases using high pressure X-ray diffraction.

목차

Abstract
1. Introduction
2. Nanoscale Computerized Tomography (nCT)
3. Scanning Transmission X-Ray Microscopy
4. X-Ray Microdiffraction
5. High-Pressure X-Ray Diffraction
6. Conclusions
References

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UCI(KEPA) : I410-ECN-0101-2014-530-002741237