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학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
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This paper proposes a low power-loss averaging current mode control using a resistor and bypass switch. Generally, current sensing method using a resistor has a disadvantage of power loss which degrades the efficiency of the entire systems. On the other hand, proposed measurement technique operating with bypass-switch connected in parallel with sensing resistor can reduce power loss significantly the current sensor. An analog-circuited bypass driver is implemented and used along with an average-circuit mode controller. The bypass switch bypasses the sensing current with a small amount of power loss. In this paper, a 50[W] prototype average current mode boost converter has been implemented for the experimental verification.
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Abstract
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2. 본론
3. 실험
4. 결론
References
참고문헌 (17)
참고문헌 신청
1. [학술지(정기간행물)] - 이화석 / 2012 / 바이패스 스위치와 저항센서를 이용한 저손실 전류 측정방법 / 전력전자학회 논문지 17 (5) : 416 ~ 422
2. [학술대회논문] - Do-Yun Kim / 2011 / Phase Current Sensing Method Using Three Shunt Resistor for Three Phase Inverter / 2011 Power Electronics Annual Conference : 235 ~ 236
3. [학술대회논문] - K.H Yeon / 2010 / Current Sensor Based on Hall Sensor and Magnetic Core for Hybrid Vehicle / ICAUMS2010 International Conference of Aums
4. [학술대회논문] - Hwa-gene Lee / 2011 / Precision evaluation of High DC current shunt / 2011 KIEE Annual Conference : 227 ~ 229
5. [학술대회논문] - K-T. Kim / 2005 / Precise Measurement of High Current Shunt Resistance / 2005 KIEE Annual Conference : 403 ~ 406
2. [학술대회논문] - Do-Yun Kim / 2011 / Phase Current Sensing Method Using Three Shunt Resistor for Three Phase Inverter / 2011 Power Electronics Annual Conference : 235 ~ 236
3. [학술대회논문] - K.H Yeon / 2010 / Current Sensor Based on Hall Sensor and Magnetic Core for Hybrid Vehicle / ICAUMS2010 International Conference of Aums
4. [학술대회논문] - Hwa-gene Lee / 2011 / Precision evaluation of High DC current shunt / 2011 KIEE Annual Conference : 227 ~ 229
5. [학술대회논문] - K-T. Kim / 2005 / Precise Measurement of High Current Shunt Resistance / 2005 KIEE Annual Conference : 403 ~ 406
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UCI(KEPA) : I410-ECN-0101-2015-500-001321500