지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
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연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2014.6
- 수록면
- 234 - 239 (6page)
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This paper proposes a new automatic detection method to inspect mura defects on display film surface using morphological image processing and labeling. This automatic detection method for mura defects on display films comprises 3 phases of preprocessing with morphological image processing, Gabor filtering, and labeling. Since distorted results could be obtained with the presence of non-uniform illumination, preprocessing step reduces illumination components using morphological image processing. In Gabor filtering, mura images are created with binary coded mura components using Gabor filters. Subsequently, labeling is a final phase of finding the mura defect area using the difference between large mura defects and values in the periphery. To evaluate the accuracy of the proposed detection method, detection rate was assessed by applying the method in 200 display film samples. As a result, the detection rate was high at about 95.5%. Moreover, the study was able to acquire reliable results using the Semu index for luminance mura in image quality inspection.
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참고문헌 (9)
참고문헌 신청
1. [보고서] - SEMI / 2002 / New Standard: Definition of Measurement Index (SEMU) for Luminance Mura in FPD
2. [학술대회논문] - Y.C Lee / 2009 / LCD Mura Detection Based on Accumulated Differences and Multi-resolution Background Subtraction
3. [학술지(정기간행물)] - C. J. Lu / 2005 / Automatic defect inspection for LCDs using singular value decomposition / International Journal of Advanced Manufacturing Technology 25 : 53 ~ 61
4. [학술지(정기간행물)] - W. C. Li / 2011 / Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection / IEEE Transactions on Industrial Informatics 7 (1) : 136 ~ 147
5. [학술지(정기간행물)] - X. Bi / 2009 / A New Mura Defect inspection way for TFT-LCD using level set method / IEEE Signal processing letters 16 (4) : 311 ~ 314
2. [학술대회논문] - Y.C Lee / 2009 / LCD Mura Detection Based on Accumulated Differences and Multi-resolution Background Subtraction
3. [학술지(정기간행물)] - C. J. Lu / 2005 / Automatic defect inspection for LCDs using singular value decomposition / International Journal of Advanced Manufacturing Technology 25 : 53 ~ 61
4. [학술지(정기간행물)] - W. C. Li / 2011 / Defect Inspection in Low-Contrast LCD Images Using Hough Transform-Based Nonstationary Line Detection / IEEE Transactions on Industrial Informatics 7 (1) : 136 ~ 147
5. [학술지(정기간행물)] - X. Bi / 2009 / A New Mura Defect inspection way for TFT-LCD using level set method / IEEE Signal processing letters 16 (4) : 311 ~ 314
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UCI(KEPA) : I410-ECN-0101-2017-056-001388304