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논문 기본 정보

자료유형
학술저널
저자정보
P. W. Srivastava (University of Delhi) D. Sharma (University of Delhi)
저널정보
한국신뢰성학회 International Journal of Reliability and Applications International Journal of Reliability and Applications 제17권 제1호
발행연도
2016.6
수록면
85 - 105 (21page)

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In this paper accelerated life testing is incorporated in quality control technique of acceptance sampling plan to induce early failures in high reliability products. Stress under accelerated condition can be applied in constant-stress, step-stress and progressive-stress or combination of such loadings. A ramp-stress results when stress is increased linearly (from zero) with time. In this paper optimum failure-censored ramp-stress accelerated life test sampling plan for log-logistic distribution has been formulated with cost considerations. The log-logistic distribution has been found appropriate for insulating materials. The optimal plans consist in finding optimum sample size, sample proportion allocated to each stress, and stress rate factor such that producer’s and consumer’s interests are safeguarded. Variance optimality criterion is used when expected cost per lot is not taken into consideration, and bilevel programming approach is used in cost optimization problems. The methods developed have been illustrated using some numerical examples, and sensitivity analyses carried out in the context of ramp-stress ALTSP based on variable SSP for proportion nonconforming.

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Abstract
1. INTRODUCTION
2. THE MODEL
3. THEORITICAL DERIVATIONS
4. OPTIMAL PLANS
5. COST STRUCTURE
6. DESIGN OF OPTIMAL SAMPLING PLAN
7. AN ILLUSTRATIVE EXAMPLE
8. SENSITIVITY ANALYSIS
9. CONCLUSION
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