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Subject

Printability assessment of patterns in printed electronics based on measurement of geometric properties
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논문 기본 정보

Type
Proceeding
Author
Cheol Kim (Chungnam National University) Chung Hwan Kim (Chungnam National University)
Journal
The Korean Society of Manufacturing Technology Engineers 한국생산제조학회 학술발표대회 논문집 Proceedings of the International Conference of Manufacturing Technology Engineers (ICMTE) 2016
Published
2016.10
Pages
86 - 86 (1page)

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Result
Printability assessment of patterns in printed electronics based on measurement of geometric properties
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UCI(KEPA) : I410-ECN-0101-2017-003-001913675