메뉴 건너뛰기
.. 내서재 .. 알림
소속 기관/학교 인증
인증하면 논문, 학술자료 등을  무료로 열람할 수 있어요.
한국대학교, 누리자동차, 시립도서관 등 나의 기관을 확인해보세요
(국내 대학 90% 이상 구독 중)
로그인 회원가입 고객센터 ENG
주제분류

추천
검색
질문

논문 기본 정보

자료유형
학술저널
저자정보
Kyungsoo Kim (Korea Institute of Energy Research)
저널정보
한국신재생에너지학회 신·재생에너지 신재생에너지 제13권 제1호 (통권 제51호)
발행연도
2017.3
수록면
54 - 59 (6page)
DOI
10.7849/ksnre.2017.3.13.1.054

이용수

표지
📌
연구주제
📖
연구배경
🔬
연구방법
🏆
연구결과
AI에게 요청하기
추천
검색
질문

초록· 키워드

오류제보하기
To reduce the demand for fossil fuel energy, one of the solutions is using an renewable energy sources, such as wind and solar. Solar energy is increasingly becoming the hottest issue in recent years because of its merits in installation and operation. In 2015, about 50.7 GW photovoltaic (PV) systems were installed around world. Many renewable energy organizations expect that the total PV system installation will be 60 GW in the coming year.[1] To sustain the long-term stability of the PV system, several institutes have performed tests based on IEC standards, such as IEC 61215 for silicon crystalline PV modules and IEC 61646 for thin film PV modules and IEC 61730-1&2 for safety tests. In the case of amorphous silicon thin film modules,[2,3] its performance can be lowered because its natural characteristics under sun light called, the Staebler-Wronski effect.[4,5] Therefore, some companies conduct light soaking tests to guarantee stable electric performance before shipment. On the other hand, in the case of having high degradation characteristics at the maximum power, this test could take much time for production and lead to an increase in product cost. To solve this technical difficulty and obtain actual stable performance power of silicon-based amorphous solar modules, the current-induced stabilization (CIS) technique was proposed and assessed.

목차

ABSTRACT
1. Introduction and Theoretical Background
2. Current Induced Stabilization (CIS) Test Method Principle
3. Experiment Result
4. Suggestion of CIS for Conventional Test Method for Manufacturer
References

참고문헌 (18)

참고문헌 신청

함께 읽어보면 좋을 논문

논문 유사도에 따라 DBpia 가 추천하는 논문입니다. 함께 보면 좋을 연관 논문을 확인해보세요!

이 논문의 저자 정보

이 논문과 함께 이용한 논문

최근 본 자료

전체보기

댓글(0)

0

UCI(KEPA) : I410-ECN-0101-2017-505-002231975