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Subject

Photoelectron spectro-microscopy/Scanning photoelectron microscopy (SPEM)
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광전자 분광현미경학

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Type
Academic journal
Author
Hyun-Joon Shin (포항가속기연구소)
Journal
The Korean Vacuum Society Vacuum Magazine Vol.3 No.4
Published
2016.12
Pages
8 - 13 (6page)

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Topic
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Background
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Method
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Result
Photoelectron spectro-microscopy/Scanning photoelectron microscopy (SPEM)
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The need of space-resolved x-ray photoelectron spectroscopy(XPS) has developed scanning photoelectron microscopy (SPEM). SPEM provides space-resolved XPS data from a spot of a sample as well as images of specific element, chemical state, valency distribution on the surface of a sample. Based on technical advancement of tight x-ray focusing, sample positioning accuracy, and electron analyzer efficiency, SPEM is now capable of providing~100 nm space resolution for typical XPS functionality, and SPEM has become actively applied for the investigation of chemical state, valency, and electronic structure on the surface of newly discovered materials, such as graphene layers, dichalcogenide 2D-materials, and heterogenous new functional materials.

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UCI(KEPA) : I410-ECN-0101-2019-420-000021508