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논문 기본 정보

자료유형
학술대회자료
저자정보
Yao Ran (Chongqing University) Zheng Meimei (Chongqing University) Li Hui (Chongqing University) Lai Wei (Chongqing University) Wang Xiao (Chongqing University) Long Haiyang (Chongqing University)
저널정보
전력전자학회 ICPE(ISPE)논문집 ICPE 2019-ECCE Asia
발행연도
2019.5
수록면
1,854 - 1,860 (7page)

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Metallized film capacitor’s (MFC’s) reliability directly affects the stable operation of MMC valve. Conventional reliability assessment method based on data statistics is limited. This paper studies the reliability modeling of MFC considering aging for the application condition of MMC valve. Firstly, the temperature field and electric field model of MFC is established, and the temperature and electric stress distribution are explored. Secondly, the lifetime model of MFC is established based on the electrical-thermal aging of dielectric films. Finally, the aging model of MFC is established from the aspect of equivalent series resistance. Results show that the aging rate of MFC increase with the service time going by, and increase sharply after 21 years. The failure rate of MFC is small at the beginning of operation, and there is a turning point in the 23rd year. Since then, the failure rate of MFC increases sharply. The lifetime of MFC is concentrated.

목차

Abstract
I. INTRODUCTION
II. PHYSICAL MODELING AND RELIABILITY MODELING OF MFC
III. RELIABILITY MODELLING AND ANALYSIS OF MFC
IV. RELIABILITY ASSESSMENT OF MFC
V. CONCLUSIONS
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