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학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
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연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
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As decreasing device size, probing of nanoscale surface properties becomes more significant. In particular, nanoscale probing of surface potential has paid much attention for understanding various surface phenomena. In this article, we review different atomic force microscopy techniques, including electrostatic force microscopy and Kelvin probe force microscopy, for measuring surface potential at the nanoscale. The review could provide fundamental information on the probing method of surface potential using atomic force microscopy.
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참고문헌 (20)
참고문헌 신청
Coffey D C / 2006 / Time-resolved electrostatic force microscopy of polymer solar cells / Nat. Mater 5 : 735 ~ 740
Collins L / 2013 / Open loop Kelvin probe force microscopy with single and multi-frequency excitation / Nanotechnology 24 : 475702 ~
Ellison D J / 2011 / Surface potential mapping of SAM-functionalized organic semiconductors by Kelvin probe force microscopy / Adv. Mater 23 : 502 ~ 507
Gady B / 1996 / Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substrate / Phys. Rev. B 53 : 8065 ~ 8070
Girard P / 2001 / Electrostatic force microscopy: principles and some applications to semiconductors / Nanotechnology 12 : 485 ~ 490
Collins L / 2013 / Open loop Kelvin probe force microscopy with single and multi-frequency excitation / Nanotechnology 24 : 475702 ~
Ellison D J / 2011 / Surface potential mapping of SAM-functionalized organic semiconductors by Kelvin probe force microscopy / Adv. Mater 23 : 502 ~ 507
Gady B / 1996 / Identification of electrostatic and van der Waals interaction forces between a micrometer-size sphere and a flat substrate / Phys. Rev. B 53 : 8065 ~ 8070
Girard P / 2001 / Electrostatic force microscopy: principles and some applications to semiconductors / Nanotechnology 12 : 485 ~ 490
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