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학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
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We suggest a facile transmission electron microscopy (TEM) specimen preparation method for the direct (polymer-free) transfer of layer-area graphene from Cu substrates to a TEM grid. The standard (polymer-based) method and direct transfer method were by TEM, high-resolution TEM, and energy dispersive X-ray spectroscopy (EDS). The folds and crystalline particles were formed in a graphene specimen by the standard method, while the graphene specimen by the direct method with a new etchant solution exhibited clean and full coverage of the graphene surface, which reduced several wet chemical steps and accompanying mechanical stresses and avoided formation of the oxide metal.
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참고문헌 (12)
참고문헌 신청
Brar V W / 2007 / Scanning tunneling spectroscopy of inhomogeneous electronic structure in monolayer and bilayer graphene on SiC / Appl. Phys. Lett 91 : 122102 ~
Dedkov Y S / 2008 / Effect in the graphene/Ni(111) gystem / Phys. Rev. Lett 100 : 107602 ~
Geim A K / 2007 / The rise of graphene / Nature Mat 6 : 183 ~
Geim A K / 2009 / Graphene: status and prospects / Science 324 : 1530 ~ 1534
Han S A / 2011 / Ridge formation and removal via annealing in exfoliated graphene / J. Nanosci. Nanotechnol 11 : 5949 ~ 5954
Dedkov Y S / 2008 / Effect in the graphene/Ni(111) gystem / Phys. Rev. Lett 100 : 107602 ~
Geim A K / 2007 / The rise of graphene / Nature Mat 6 : 183 ~
Geim A K / 2009 / Graphene: status and prospects / Science 324 : 1530 ~ 1534
Han S A / 2011 / Ridge formation and removal via annealing in exfoliated graphene / J. Nanosci. Nanotechnol 11 : 5949 ~ 5954
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