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논문 기본 정보
- 자료유형
- 학술대회자료
- 저자정보
- 발행연도
- 2023.5
- 수록면
- 1,443 - 1,448 (6page)
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초록· 키워드
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Modular multilevel converters (MMCs) with reduced voltage sensors replace individual voltage sensors with group voltage sensors. Such a configuration reduces hardware cost and communication burden, but degrades the performance of MMCs. Controllable power semiconductors are one of the fault-prone components in MMCs, and their open-circuit faults have received extensive attention. This paper proposes a switch open-circuit fault diagnosis method based on carrier phase-shift modulation for MMCs with reduced voltage sensors. The arm sub-modules (SMs) are divided into multiple groups. Fault diagnosis is performed with reference to the residual of the estimated group voltage and the measured group voltage. Through exquisitely designed sampling instants, multiple faulty SMs can be identified within one carrier cycle. The moment when any triangular carrier reaches the peak is the sampling instant. Simulations results verify the effectiveness and feasibility of the proposed method.
목차
Abstract
I. INTRODUCTION
II. MMC BASIC AND SM FAULT CHARACTERISTICS
III. THE PROPOSED FAULT DIAGNOSIS METHOD
IV. SIMULATION RESULTS
V. CONCLUSION
REFERENCES
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