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논문 기본 정보

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학위논문
저자정보

온범수 (광운대학교, 광운대학교 대학원)

지도교수
권기청
발행연도
2021
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이 논문의 연구 히스토리 (2)

초록· 키워드

오류제보하기
플라즈마 시장 규모가 증대해짐에 따라 반도체 산업에서의 플라즈마 변수 측
정 및 연구가 더욱 요구되고 있다. 또한 공정의 난이도가 증가됨에 따라 공정
의 재현성 및 안정성 확보를 비롯한 필요성 역시 증가되고 있기에 공정 상태를
진단하는 기술의 중요성도 증가했다. 플라즈마 진단에 관한 연구는 기존 방식
에서 국부적인 영역의 측정만 이루어지고 있으며 산업체 내에서 공정 중에 실
시간으로 측정하기엔 한계가 있으며 플라즈마 벌크 내에 변수를 정밀히 측정한
다 하여도 탐침 형태의 진단계는 탐침 자체의 섭동을 비롯하여 가스 유량 및
전기장의 변화를 주어 측정하게 된다. 또한 실제 공정은 기판 위에서 이루어지
기 때문에 궁극적으로 기판 위에서의 공정 모니터링이 필요하다.
본 논문에서는 웨이퍼 형태의 진단 센서를 이용해 측정하여 랑뮤어 탐침
(Langmuir probe)과 플라즈마 진동 주파수 탐침 방식(Plasma oscillation probe
method), 컷오프 탐침 방식(Cut-off probe method)을 이용하여 비교 진행하였
으며 웨이퍼 센서 유무에 따른 플라즈마 특성을 진단하기 위해 사중극자 질량
분석기(Quadrupole Mass Spectrometer, QMS)와 발광분광분석법(Optical
Emission spectroscopy, OES)을 이용하여 측정하였다.

목차

I. 서론 ·································································································································1
II. 관련이론 ·······················································································································2
2.1. Plasma ·······················································································································2
2.1.1. Plasma 정의········································································································2
2.1.2. Plasma 변수········································································································3
2.1.3. Plasma 소스······································································································23
2.2. Plasma 진단 기술·································································································30
2.2.1. 단일 랑뮤어 탐침법 ·························································································31
2.2.2. 이중 랑뮤어 탐침법 ·························································································36
2.2.3. 플라즈마 진동 주파수 탐침법 ·······································································38
2.2.4. 컷오프 탐침법 ···································································································40
2.2.5. 발광분광분석법 ·································································································42
2.2.6. 사중극자질량분석기 ·························································································43
2.3. 캐패시턴스 측정법을 이용한 웨이퍼형 센서 시스템 ······································47
2.3.1 측정 시스템 장치 구성 ····················································································47
2.3.2 측정 시스템 원리 ······························································································49
III. 실험 ···························································································································53
3.1. 연구 목적 및 필요성····························································································53
3.2. 측정 조건 및 결과 ································································································55
3.2.1. 인가 전력과 압력에 따른 실험
(플라즈마 주파수 프로브 + 단일 랑뮤어 탐침 + 웨이퍼 센서) ············ 56
3.2.2. 플라즈마 균일도 실험
(단일, 이중 랑뮤어 탐침 + 웨이퍼 센서) ····················································75
3.2.3. 웨이퍼 센서 유무에 따른 실험
(단일 랑뮤어 탐침 + 웨이퍼 센서 +발광분광법 +사중극자질량분석기) ··· 79
3.2.4. 인가 전력에 따른 실험
(컷오프 탐침 + 웨이퍼 센서) ·········································································86
3.2.5. 안테나(Antenna)와 척(Chuck) 간의 거리에 따른 실험
(컷오프 탐침 + 웨이퍼 센서) ·········································································92
IV. 결론 ···························································································································97
V. 참고 문헌 ··················································································································99

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