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학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
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Here we show how by processing energy dispersive X-ray spectrometry (EDS) data obtained using highly sensitive, new generation EDS detectors in the AZtec LayerProbe software we can obtain data of sufficiently high quality to non-destructively measure the number of layers in two-dimensional (2D) MoS2 and MoS2/WSe2 and thereby enable the characterization of working devices based on 2D materials. We compare the thickness measurements with EDS to results from atomic force microscopy measurements. We also show how we can use electron backscatter diffraction (EBSD) to address fabrication challenges of 2D materials. Results from EBSD analysis of individual flakes of exfoliated MoS2 obtained using the Nordlys Nano detector are shown to aid a better understanding of the exfoliation process which is still widely used to produce 2D materials for research purposes.
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참고문헌 (4)
참고문헌 신청
Butler S Z / 2013 / Progress, challenges, and opportunities in two-dimensional materials beyond graphene / ACS Nano 7 : 2898 ~ 2926
Lang C / 2013 / Non-destructive measurement of a combinatorial materials library for all-oxide solar cells / Microsc. Microanal 19 : 1872 ~ 1873
Novoselov K S / 2004 / Electric field effect in atomically thin carbon films / Science 306 : 666 ~ 669
최수호 / 2014 / Layer-number-dependent Work Function of MoS2 Nanoflakes / Journal of the Korean Physical Society 64 (10) : 1550 ~ 1554
Lang C / 2013 / Non-destructive measurement of a combinatorial materials library for all-oxide solar cells / Microsc. Microanal 19 : 1872 ~ 1873
Novoselov K S / 2004 / Electric field effect in atomically thin carbon films / Science 306 : 666 ~ 669
최수호 / 2014 / Layer-number-dependent Work Function of MoS2 Nanoflakes / Journal of the Korean Physical Society 64 (10) : 1550 ~ 1554
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