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논문 기본 정보

자료유형
학술저널
저자정보
Yunsung Huh (Finesolution) Yunseok Hwang (Finesolution) Jeha Kim (Cheongju University)
저널정보
한국진공학회(ASCT) Applied Science and Convergence Technology Applied Science and Convergence Technology Vol.27 No.4
발행연도
2018.7
수록면
61 - 65 (5page)

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초록· 키워드

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We studied the critical pressure characteristics of an anode type ion beam source driven by both charge repulsion and diffusion mechanism. The critical pressure Pcrit of the diffusion type ion beam source was linearly decreased from 2.5 mTorr to 0.5 mTorr when the gas injection was varied in 3~10 sccm, while the Pcrit of the charge repulsion ion beam source was remained at 3.5 mTorr. At the gas injection of 10 sccm, the range of having normal beam shape in the charge repulsion ion beam source was about 6.4 times wider than that in the diffusion type ion beam source. An impurity of Fe 2p (KE = 776.68 eV) of 12.88 at. % was observed from the glass surface treated with the abnormal beam of the charge repulsion type ion beam source. The body temperature of the diffusion type ion beam source was observed to increase rapidly at the rate of 1.9℃/min for 30 minutes and to vary slowly at the rate of 0.1℃/ min for 200 minutes for an abnormal beam and normal beam, respectively.

목차

Abstract
Ⅰ. Introduction
Ⅱ. Experiments
Ⅲ. Results and Discussion
Ⅳ. Conclusions
References

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