메뉴 건너뛰기
.. 내서재 .. 알림
소속 기관/학교 인증
인증하면 논문, 학술자료 등을  무료로 열람할 수 있어요.
한국대학교, 누리자동차, 시립도서관 등 나의 기관을 확인해보세요
(국내 대학 90% 이상 구독 중)
로그인 회원가입 고객센터 ENG
주제분류

추천
검색

논문 기본 정보

자료유형
학술저널
저자정보
Shin, H.S. (School of Mechanical Engineering, Andong National University) Dedicatoria, M.J. (School of Mechanical Engineering, Andong National University) Lee, N.J. (Korea Electrotechnology Research Institute) Oh, S.S. (Korea Electrotechnology Research Institute)
저널정보
한국초전도저온학회 한국초전도·저온공학회논문지 한국초전도·저온공학회논문지 제11권 제4호
발행연도
2009.1
수록면
12 - 15 (4page)

이용수

표지
📌
연구주제
📖
연구배경
🔬
연구방법
🏆
연구결과
AI에게 요청하기
추천
검색

초록· 키워드

오류제보하기
The $I_c$ degradation behavior of critical current in differently processed YBCO and SmBCO CC tapes with IBAD template has been investigated. It has been known that the residual strain in the CC tape will influence the shape of the $I_c$-strain window; $I_c$ may show a peak value if there exist a residual strain induced in the tape during manufacturing. The difference of residual strain may be resulted from the adopted different deposition techniques. In this study, bending test of CC tapes has been done using the Goldacker bending test rig which can produce both compressive and tensile bending strain continuously or alternately to the sample. For SmBCO CC tapes, in continuous compressive bending test, $I_c$ showed a minimal increase and did not degrade up to the largest strain that can be applied using the bending rig equivalent to 1.15% based on the sample thickness. However, in the case of alternate application of compressive and tensile bending strain, $I_c$ showed a larger degradation and a lower reversible limit when compared with the case of continuous application of the bending strain. When $I_c$ started to degrade significantly at the tension side, the reversibility ended, also at the compression side which is resulted from the permanent deformation like delamination or cracks that was induced due to tensile bending strain.

목차

등록된 정보가 없습니다.

참고문헌 (0)

참고문헌 신청

함께 읽어보면 좋을 논문

논문 유사도에 따라 DBpia 가 추천하는 논문입니다. 함께 보면 좋을 연관 논문을 확인해보세요!

이 논문의 저자 정보

최근 본 자료

전체보기

댓글(0)

0