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논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 저널정보
- 대한전자공학회 IEIE Transactions on Smart Processing & Computing IEIE Transactions on Smart Processing & Computing Vol.10 No.2
- 발행연도
- 2021.4
- 수록면
- 167 - 175 (9page)
- DOI
- 10.5573/IEIESPC.2021.10.2.167
이용수
초록· 키워드
오류제보하기
As the size of technology shrinks, its immunity to the space radiation environment decreases. A single-event transient (SET) induced by radiation can cause permanent damage to devices. Therefore, engineers have been researching radiation-hardened flip-flops or latches that are robust to soft errors. This paper proposes a true-single-phase-clock (TSPC)-based single-node-upset (SNU)-tolerant flip-flop, which is robust to SNUs and even faster than conventional DFFs. This flip-flop consists of two modules of TSPC flip-flops, except for inverters, and a Muller C-element. It has only 22 transistors, which makes it area-efficient. Moreover, the proposed flip-flop uses a TSPC; hence, the clock-to-Q delay is 10% less than the conventional DFF.
목차
Abstract
1. Introduction
2. Previous RHBD Flip-flops
3. Proposed Flip-flop
4. Simulation Results
5. Conclusion
References
참고문헌 (11)
참고문헌 신청
S. Jagannathan et al., “Single-Event Tolerant Flip-Flop Design in 40-nm Bulk CMOS Technology,” IEEE Transactions on Nuclear Science, Vol. 58, No. 6, pp. 3033–3037, Dec. 2011. Article (CrossRef Link)
S. A. Aketi, J. Mekie and H. Shah, “Single-Error Hardened and Multiple-Error Tolerant Guarded Dual Modular Redundancy Technique,” 2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID), pp. 250–255, 2018. Article (CrossRef Link)
R. Perez, “Analysis and simulations of space radiation induced single event transients,” 2016 ESA Workshop on Aerospace EMC (Aerospace EMC), pp. 1–6, 2016. Article (CrossRef Link)
Y.-Q. Li et al., “A Quatro-Based 65-nm Flip-Flop Circuit for Soft-Error Resilience,” IEEE Transactions on Nuclear Science, Vol. 64, No. 6, pp. 1554–1561, Jun. 2017. Article (CrossRef Link)
D. Ro, C. Min, M. Kang, I. J. Chang, and H.-M. Lee, "A Radiation-Hardened SAR ADC with Delay-Based Dual Feedback Flip-Flops for Sensor Readout Systems," MDPI Sensors, Vol. 20, No. 1, Jan. 2020.
S. A. Aketi, J. Mekie and H. Shah, “Single-Error Hardened and Multiple-Error Tolerant Guarded Dual Modular Redundancy Technique,” 2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID), pp. 250–255, 2018. Article (CrossRef Link)
R. Perez, “Analysis and simulations of space radiation induced single event transients,” 2016 ESA Workshop on Aerospace EMC (Aerospace EMC), pp. 1–6, 2016. Article (CrossRef Link)
Y.-Q. Li et al., “A Quatro-Based 65-nm Flip-Flop Circuit for Soft-Error Resilience,” IEEE Transactions on Nuclear Science, Vol. 64, No. 6, pp. 1554–1561, Jun. 2017. Article (CrossRef Link)
D. Ro, C. Min, M. Kang, I. J. Chang, and H.-M. Lee, "A Radiation-Hardened SAR ADC with Delay-Based Dual Feedback Flip-Flops for Sensor Readout Systems," MDPI Sensors, Vol. 20, No. 1, Jan. 2020.
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