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연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술저널
- 저자정보
- 발행연도
- 2021.6
- 수록면
- 1 - 7 (7page)
- DOI
- 10.1186/s42649-021-00057-8
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초록· 키워드
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Growing demands for comprehending complicated nano-scale phenomena in atomic resolution has attracted in-situ transmission electron microscopy (TEM) techniques for understanding their dynamics. However, simple to safe TEM sample preparation for in-situ observation has been limited. Here, we suggested the optical microscopy based micro-manipulating system for transferring TEM samples. By adopting our manipulator system, several types of samples from nano-wires to plate-like thin samples were transferred on micro-electro mechanical systems (MEMS) chip in a single step. Furthermore, the control of electrostatic force between the sample and the probe tip is found to be a key role in transferring process.
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참고문헌 (13)
참고문헌 신청
J. Damiano / 2008 / A MEMS-based technology platform for in-situ TEM heating studies / Microsc. Microanal. 14(S2):1332
L. A. Giannuzzi / 2015 / Theory and new applications of ex situ lift out / Microsc. Microanal 21(4):1034
W. Li / 2020 / An in-situ TEM microreactor for real-time nanomorphology & physicochemical parameters interrelated characterization / Nano Today 35:100932
J. Mayer / 2007 / TEM sample preparation andFIBinduced damage / MRS Bull 32(5):400~407
L. Mele / 2016 / A MEMS-based heating holder for the direct imaging of simultaneous in-situ heating and biasing experiments in scanning/ transmission electron microscopes / Microsc. Res. Tech 79(4):239~250
L. A. Giannuzzi / 2015 / Theory and new applications of ex situ lift out / Microsc. Microanal 21(4):1034
W. Li / 2020 / An in-situ TEM microreactor for real-time nanomorphology & physicochemical parameters interrelated characterization / Nano Today 35:100932
J. Mayer / 2007 / TEM sample preparation andFIBinduced damage / MRS Bull 32(5):400~407
L. Mele / 2016 / A MEMS-based heating holder for the direct imaging of simultaneous in-situ heating and biasing experiments in scanning/ transmission electron microscopes / Microsc. Res. Tech 79(4):239~250
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