지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
이용수
초록· 키워드
오류제보하기
Solder/electroless nickel immersion gold (ENIG) joint sample which is comprised of dissimilar materials with different mechanical properties has limited the level of success in preparing thin samples for transmission electron microscopy (TEM). This short technical note reports the operation parameters for ultramicrotomy of solder joint sample and TEM analysis results. The solder joint sample was successfully sliced to 50~70 nm thick lamellae at slicing speed of 0.8~1.2 mm/s using a boat-type 45o diamond knife. Ultramicrotomy can be applied as a routine sample preparation technique for TEM analysis of solder joints.
목차
등록된 정보가 없습니다.
참고문헌 (7)
참고문헌 신청
Becker O / 1993 / Ultramicrotomy: an alternative cross sections preparation for oxidic thin films on glass / Ultramicroscopy 52:73~84
Glanvill S R / 1995 / Ultramicrotomy of semiconductors and related materials / Microsc. Res. Tech 31:275~284
Howell D A / 1995 / Preparation of metal multilayer TEM cross-section using ultramicrotomy / J. Microsc 180:182~185
Hwang C W / 2003 / Interface microstructures between Ni-P plating and Sn-Ag-(Cu) lead-free solders / J. Mater. Res 18:2540~2543
Kang H B / 2008 / Initial interfacial reaction layers formed in Sn-3.5Ag solder/electroless Ni-P plated Cu substrate system / J. Mater. Res 23:2195~2201
Glanvill S R / 1995 / Ultramicrotomy of semiconductors and related materials / Microsc. Res. Tech 31:275~284
Howell D A / 1995 / Preparation of metal multilayer TEM cross-section using ultramicrotomy / J. Microsc 180:182~185
Hwang C W / 2003 / Interface microstructures between Ni-P plating and Sn-Ag-(Cu) lead-free solders / J. Mater. Res 18:2540~2543
Kang H B / 2008 / Initial interfacial reaction layers formed in Sn-3.5Ag solder/electroless Ni-P plated Cu substrate system / J. Mater. Res 23:2195~2201
함께 읽어보면 좋을 논문
논문 유사도에 따라 DBpia 가 추천하는 논문입니다. 함께 보면 좋을 연관 논문을 확인해보세요!
-
Development of High-Temperature Solders: Contribution of Transmission Electron Microscopy
한국현미경학회지
2015 .01
-
TEM sample preparation using micro-manipulator for in-situ MEMS experiment
한국현미경학회지
2021 .06
-
Transmission Electron Microscopy Specimen Preparation of Delicate Materials Using Tripod Polisher
한국현미경학회지
2016 .01
-
Transmission Electron Microscopy Sample Preparation of Ge2Sb2Te5 Nanowire Using Electron Beam
한국현미경학회지
2015 .01
-
TEM sample preparation of microsized LiMn2O4 powder using an ion slicer
한국현미경학회지
2021 .12
-
Transmission Electron Microscope Sampling Method for Three-Dimensional Structure Analysis of Two-Dimensional Soft Materials
한국현미경학회지
2015 .01
-
A study on the characterization of certified reference material for Sn-Sb based lead free solder
한국분석과학회 학술대회
2015 .11
-
투과전자현미경과 분석법의 소개
물리학과 첨단기술
2023 .08
-
The Effects of Electron Beam Exposure Time on Transmission Electron Microscopy Imaging of Negatively Stained Biological Samples
한국현미경학회지
2015 .01
-
투과전자현미경을 이용한 2차원 물질 연구
물리학과 첨단기술
2023 .09
-
초저온 전자현미경법을 통한 고분해능 생물분자 구조분석
진공이야기
2017 .12
-
Three-Dimensional Automated Crystal Orientation and Phase Mapping Analysis of Epitaxially Grown Thin Film Interfaces by Using Transmission Electron Microscopy
한국현미경학회지
2015 .01
-
Sublimable materials facilitate the TEM sample preparation of oil-soluble nanomaterials
한국현미경학회지
2020 .01
-
Applying microscopic analytic techniques for failure analysis in electronic assemblies
한국현미경학회지
2019 .01
-
Analyzing the microstructure and related properties of 2D materials by transmission electron microscopy
한국현미경학회지
2019 .01
-
분광기능이 융합된 광전자융합현미경의 개발
한국진공학회 학술발표회초록집
2020 .08
-
Specimen Preparation for Scanning Electron Microscope Using a Converted Sample Stage
한국현미경학회지
2015 .01
-
Preparation Method of Plan-View Transmission Electron Microscopy Specimen of the Cu Thin-Film Layer on Silicon Substrate Using the Focused Ion Beam with Gas-Assisted Etch
한국현미경학회지
2015 .01
-
3D analysis of material using scanning electron microscopy and focused ion beam
한국분석과학회 학술대회
2017 .05
-
Current Status of Automatic Serial Sections for 3D Electron Microscopy
한국현미경학회지
2017 .01
이 논문의 저자 정보
최근 본 자료
댓글(0)
0