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논문 기본 정보

자료유형
학술대회자료
저자정보
오광환 (한국생산기술연구원) 정혜정 (한국생산기술연구원) 지은옥 (OCI) 김지찬 (OCI) 부성재 (한국생산기술연구원)
저널정보
한국태양에너지학회 한국태양에너지학회 학술대회논문집 한국태양에너지학회 2010년도 춘계학술발표대회 논문집
발행연도
2010.4
수록면
132 - 137 (6page)

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초록· 키워드

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Characteristics of crystallization of amorphous silicon (a-Si) utilizing aluminum-induced crystallization (AIC) and layer exchange process with a glass/Al/Ox/a-Si structure are investigated in this paper. The fabrication of polycrystalline silicon (pc-Si) seed layer for a pc-Si thin film solar cell with the maximum grain size of 45 ㎛ in length is carried out by appropriately adjusting the oxide film thickness and annealing temperature. Aluminum oxide (Al₂O₃) film which plays a significant role as the buffer layer between Al and amorphous silicon (a-Si) films was sputtered on the Al/glass bilayer with the different thicknesses. The a-Si was deposited on the Al₂O₃ thin film by plasma enhance chemical vapor deposition (PECVD) method. The workpieces were heated for two hours to induce AIC process at three different temperatures of 450, 500 and 550℃.
Once the a-Si was crystallized by AIC process, the silicon peak of 520 ㎝?¹ from Raman spectroscopy analysis was detected regardless of Al₂O₃ layer thickness even if the degree of crystallization can exist.
The Si grains with an average size ranging from 25 to 45 ㎛ can be fabricated with the same thickness ratio of a-Si/Al. From X-ray diffraction (XRD) data, the dominant crystal orientation of Si(111) together with Si(202), Si(220), Si(311) and Si(400) is found at the relatively high temperature over 500℃ whereas no Si crystal peak except Si(202) can be obtained at 450℃ after annealing.
The effects of process variables such as buffer layer thickness, annealing temperature and heating time upon the AIC results including grain size and orientation of pc-Si are demonstrated in detail.

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Abstract
1. 서론
2. 실험
3. 결과 및 논의
5. 결론
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UCI(KEPA) : I410-ECN-0101-2010-563-003376873