지원사업
학술연구/단체지원/교육 등 연구자 활동을 지속하도록 DBpia가 지원하고 있어요.
커뮤니티
연구자들이 자신의 연구와 전문성을 널리 알리고, 새로운 협력의 기회를 만들 수 있는 네트워킹 공간이에요.
논문 기본 정보
- 자료유형
- 학술대회자료
- 저자정보
- 저널정보
- 대한전자공학회 ICEIC : International Conference on Electronics, Informations and Communications ICEIC : 2010
- 발행연도
- 2010.6
- 수록면
- 349 - 351 (3page)
이용수
초록· 키워드
오류제보하기
Peak power dissipation in scan based testing is very significant concern because it can cause the chip being tested fail by reliability problem in future and fail by shortage in voltage margin. The partitioning techniques of scan chain are greatly effective in reducing peak power dissipation in scan chains, combinational logic and clock tree because only small portion of scan chains is toggled at any instance. In this paper, we propose four-dynamic partiti ... 전체 초록 보기
목차
Abstract
Ⅰ. Introduction
Ⅱ. Dynamic Scan Chain Partitioning
Ⅲ. Hardware of Four-Dynamic Scan Chain Partitioning
Ⅳ. Experiment Results
Ⅴ. Conclusions
Acknowledgments
References
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UCI(KEPA) : I410-ECN-0101-2012-569-004077471