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논문 기본 정보

자료유형
학술저널
저자정보
Sunjoon Park (DMS Inc.) Seokyeon Im (Tongmyong University) Hyunseop Lee (Tongmyong University)
저널정보
한국트라이볼로지학회 Tribology and Lubricants 윤활학회지 제33권 제6호
발행연도
2017.12
수록면
282 - 287 (6page)

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초록· 키워드

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SU-8 is an epoxy-type photoresist widely used for the fabrication of high-aspect-ratio (HAR) microstructures in micro-electro-mechanical systems (MEMS). To fabricate highly integrated structures, chemical mechanical polishing (CMP) has emerged as the preferred manufacturing process for planarizing the MEMS structure. In SU-8 CMP, an oxidizer decomposes organic impurities and particles in the CMP slurry remove the chemically reacted surface of SU-8. To fabricate HAR microstructures using the CMP process, the adhesion between SU-8 and substrate material is important to avoid the delamination of the SU-8 film caused by the mechanical-dominant material removal characteristic. In this study, the friction force during the CMP process is measured with a CMP monitoring system to detect the delamination phenomenon and investigate the delamination of the SU-8 film from the silicon substrate under various pressure conditions. The increase in applied pressure causes an increase in the frictional force and wafer-edge stress concentration. The frictional force measurement shows that the friction force changes according to the delamination phenomenon of the SU-8 film, and that it is possible to monitor the delamination phenomenon during the SU-8 CMP process. The delamination at a high applied pressure is explained by the effect of stress distribution and pad deformation. Consequently, it is necessary to control the pressure of polishing, which can avoid the delamination in SU-8 CMP.

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Abstract
1. Introduction
2. Experiment
3. Results and Consideration
5. Conclusion
References

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